Mission profile-based assessment of semiconductor technologies for automotive applications

dc.contributor.author	Ahari, Ali
dc.contributor.author	Bringmann, Oliver
dc.contributor.author	Rosenstiel, Wolfgang
dc.date.accessioned	2019-06-13T14:10:49Z
dc.date.available	2019-06-13T14:10:49Z
dc.date.issued	2018
dc.identifier.issn	0026-2714
dc.identifier.uri	http://hdl.handle.net/10900/89620
dc.language.iso	en	en
dc.publisher	Pergamon - Elsevier Science Ltd	de_DE
dc.relation.uri	http://dx.doi.org/10.1016/j.microrel.2018.08.008
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.ddc	600	de_DE
dc.subject.ddc	530	de_DE
dc.title	Mission profile-based assessment of semiconductor technologies for automotive applications	de_DE
dc.type	Article	de_DE
utue.quellen.id	20190321153956_00212
utue.publikation.seiten	129-138	de_DE
utue.personen.roh	Ahari, Ali
utue.personen.roh	Viehl, Alexander
utue.personen.roh	Bringmann, Oliver
utue.personen.roh	Rosenstiel, Wolfgang
dcterms.isPartOf.ZSTitelID	Microelectronics Reliability	de_DE
dcterms.isPartOf.ZS-Volume	91	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät