| dc.contributor.author |
Willsch, Benjamin |
|
| dc.contributor.author |
Kumar, Praveen |
|
| dc.contributor.author |
Eibl, Oliver |
|
| dc.date.accessioned |
2016-12-14T15:27:48Z |
|
| dc.date.available |
2016-12-14T15:27:48Z |
|
| dc.date.issued |
2016 |
|
| dc.identifier.issn |
1543-186X |
|
| dc.identifier.uri |
http://hdl.handle.net/10900/73727 |
|
| dc.language.iso |
en |
de_DE |
| dc.publisher |
Springer |
de_DE |
| dc.relation.uri |
http://dx.doi.org/10.1007/s11664-016-4459-8 |
de_DE |
| dc.rights |
info:eu-repo/semantics/closedAccess |
|
| dc.subject.ddc |
530 |
de_DE |
| dc.subject.ddc |
600 |
de_DE |
| dc.title |
Front Side Metallization of n- and p-Type, High-Efficiency, Single-Crystalline Si Solar Cells: Assessing the Temperature-Dependent Series Resistance |
de_DE |
| dc.type |
Article |
de_DE |
| utue.quellen.id |
20160915142648_00675 |
|
| utue.publikation.seiten |
2656-2661 |
de_DE |
| utue.personen.roh |
Willsch, Benjamin |
|
| utue.personen.roh |
Kumar, Praveen |
|
| utue.personen.roh |
Eibl, Oliver |
|
| dcterms.isPartOf.ZSTitelID |
Journal of Electronic Materials |
de_DE |
| dcterms.isPartOf.ZS-Issue |
6 |
de_DE |
| dcterms.isPartOf.ZS-Volume |
45 |
de_DE |
| utue.fakultaet |
07 Mathematisch-Naturwissenschaftliche Fakultät |
de_DE |