Characterization of Oxide Layers on Technical Copper Material Using Ultraviolet Visible (UV-Vis) Spectroscopy as a Rapid On-Line Analysis Tool

dc.contributor.author	Stiedl, Jan
dc.contributor.author	Chassé, Thomas
dc.date.accessioned	2020-05-26T14:54:32Z
dc.date.available	2020-05-26T14:54:32Z
dc.date.issued	2019
dc.identifier.issn	1943-3530
dc.identifier.uri	http://hdl.handle.net/10900/100997
dc.language.iso	en	en
dc.publisher	Sage Publications Inc	de_DE
dc.relation.uri	http://dx.doi.org/10.1177/0003702818797959	de_DE
dc.subject.ddc	600	de_DE
dc.subject.ddc	540	de_DE
dc.subject.ddc	530	de_DE
dc.title	Characterization of Oxide Layers on Technical Copper Material Using Ultraviolet Visible (UV-Vis) Spectroscopy as a Rapid On-Line Analysis Tool	de_DE
dc.type	Article	de_DE
utue.quellen.id	20190926111821_03337
utue.publikation.seiten	59-66	de_DE
utue.personen.roh	Stiedl, Jan
utue.personen.roh	Green, Simon
utue.personen.roh	Chasse, Thomas
utue.personen.roh	Rebner, Karsten
dcterms.isPartOf.ZSTitelID	Applied Spectroscopy	de_DE
dcterms.isPartOf.ZS-Issue	1	de_DE
dcterms.isPartOf.ZS-Volume	73	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE